Publikace 2010
Jirák, Josef; Neděla, Vilém; Černoch, P.; Čudek, P.; Runštuk, Jiří. Scintillation SE detector for variable pressure scanning electron microscopes. Journal of Microscopy. 2010, roč. 239, č. 3, s. 233-238. ISSN 0022-2720.
Neděla, Vilém. Controlled dehydration of a biological sample using an alternative form of environmental SEM. Journal of Microscopy. 2010, roč. 237, č. 1, s. 7-11. ISSN 0022-2720.
Flodrová, Eva; Neděla, Vilém. Study of intestinal mucosa in high pressure conditions of variable pressure SEM. In Frank, L.; Hozák, P. (ed.). Mikroskopie 2010. Nové Město na Moravě : Československá mikroskopická společnost, 2010, s. 33. ISBN N. [Mikroskopie 2010, Nové Město na Moravě, 17.02.2010-18.02.2010, CZ].
Jirák, Josef; Čudek, P.; Neděla, Vilém. Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes. In Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, i10.14: 1-2. ISBN 978-85-63273-06-2. [International Microscopy Congress (IMC17) /17./, Rio de Janeiro, 19.09.2010-24.09.2010, BR].
Maxa, J.; Neděla, Vilém. Use of electronics product definition for the development of differentially pumped chamber. In EDS’10 – Electronic Devices and Systems IMAPS CS International Conference 2010 – Proceedings. Brno: Vysoké učení technické v Brně, 2010, s. 215-223. ISBN 978-80-214-4138-5. [EDS '10 - Electronic Devices and Systems IMAPS CS International Conference, Brno, 01.09.2010-02.09.2010, CZ].
Neděla, Vilém; Konvalina, I.; Lencová, B.; Zlámal, J. Comparison of calculated, simulated and measured signal amplification in variable pressure SEM. In Eighth International Conference on Charged Particle Optics CPO-8. Singapore : National University of Singapore, 2010. s. 81-82.
Neděla, Vilém; Bařinka, R.; Hladík, V.; Flodrová, Eva. Investigation of solar cell structures after laser beam processing. In Focus on Microscopy – FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 225.
Neděla, Vilém; Jirák, Josef. Newly Designed Ionisation Secondary Electron Detector with Electrostatic Separators for VP-ESEM. In Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, i10.9: 1-2. ISBN 978-85-63273-06-2. [International Microscopy Congress (IMC17) /17./, Rio de Janeiro, 19.09.2010-24.09.2010, BR].
Neděla, Vilém; Krejčí, J.; Sajdlová, Z.; Flodrová, Eva. Study of surfaces of electrochemical sensors using optical and scanning electron microscopy. In Focus on Microscopy – FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 226.
Maxa, Jiří; Neděla, Vilém. Differntially pumped chambre of VP-SEM computed by the use of COSMOS FLOWORKS SOFTWARE. In Electronic Devices and Systems. Brno: Novapress s.r.o., 2010. p. 215-223. ISBN: 978-80-214-4138-5.